Together since 2007

Transforming money management to make financial markets accessible to all

Acquired since 2021

Enabling the human right of mobility to all

Acquired since 2017

Introducing Zero Trust mechanisms for a truly sale environment

Acquired since 1994

Introduced cyber security to the mass business market

Together since 2010

Harnessing the power of artificial vision to transform the lives of visually impaired

Together since 2020

Digital Learning Platform designed to optimize student engagement and learning outcome

Together since 2019

AI-driven end-to-end Fix & Flip platform

Together since 2021

First drone delivery service focused in the US suburbs.

Acquired by DG 2007

Global provider of digital advertising solutions that optimize the use of media, creative and data for enhanced performance.

Together since 2010

Leading investment house in Israel, managing over 77 Billion Dollars for private, business and institutional clients

Together since 2016

Developing and commercializing novel endovascular treatments for stroke

Together since 2012

Developing percutaneous implantable technologies for patients with chronic heart failure

JDSU Announces First TDD-LTE Drive-Test System with Support for Altair Chipsets

The JDSU E6474A Drive-Test solution now provides market-leading TDD-LTE functionality with the introduction of Altair-chipset-device support. JDSU is the first test-equipment supplier to offer Altair compatibility, building on its established FDD-LTE drive-test solution.

This system enables increased productivity via a single test solution that supports multiple types of user equipment (UE). The solution demonstrates unprecedented scalability across multiple wireless technologies to include TDD-LTE, can be customized to meet the user’s precise needs, and is easily upgraded via software.

To accelerate the deployment of TDD-LTE networks, mobile operators and network-equipment manufacturers need to collect and analyze critical LTE RF parametric network data. This is facilitated via the use of real LTE UE such as Altair, which improves testing with end-user-form-factor devices.

Additional solution benefits include:
* monitoring of key LTE KPIs from a UE-based solution, resulting in faster identification of network issues
* RF parametric measurements and data performance tests including throughput, MIMO status, power, and signal quality
* complete network lifecycle coverage with a single tool that scales from initial trials to on-going optimization and troubleshooting.

The E6474A Drive-Test solution with Altair support is available now for new customers as well as the existing JDSU drive-test installed base.